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A New Approach to Microns-Resolution Trace Element and Mineralogy Mapping at PPM Sensitivity for Digital Rock and Geological Research
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 2176-2177
- Print publication:
- July 2017
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Development of an X-ray Based Spectroscopy MicroXRF System with LA-ICP-MS Capabilities: Trace-Level Microns-scale Mapping and Femtogram Detection Sensitivity
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 44-45
- Print publication:
- July 2017
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Novel, High Brightness X-ray Source and High Efficiency X-ray Optic for Development of X-ray Instrumentation
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 118-119
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- July 2016
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Standardless Quantification at Trace Elemental (PPM) Levels Using a Novel Attachment within an Electron Microscope and Microprobe
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 436-437
- Print publication:
- July 2016
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